GaN growth on porous silicon by MOVPE

نویسندگان

  • T. Boufaden
  • N. Chaaben
  • M. Christophersen
  • B. El Jani
چکیده

GaN films have been grown at 1050 8C on porous silicon (PS) substrates by metalorganic vapour phase epitaxy. The annealing phase of PS has been studied in temperature range from 300 to 1000 8C during 10 min under a mixture of ammonia (NH3) and hydrogen (H2). The PS samples were characterized after annealing by scanning electronic microscope (SEM). We observed that the annealing under the GaN growth conditions does not affect the porous structure. For the growth of the active GaN layer we used a thin AlN layer in order to improve wetting between GaN and PS/Si substrate. The growth of AlN and GaN films was controlled by laser-reflectometry. We estimated the porosity of PS samples from the evolution of the reflectivity signal during the AlN growth. The crystalline quality and surface morphology of GaN films were determined by X-ray diffraction and SEM, respectively. Preferential growth of hexagonal GaN with (0002) direction is observed and is clearly improved when the thickness of AlN layer increases. Epitaxial GaN layers were characterized by photoluminescence. q 2003 Elsevier Science Ltd. All rights reserved.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Structural and optical characterization of GaN grown on porous silicon substrate by MOVPE

GaN was grown on porous silicon (PS) substrates by Metalorganic Vapour Phase Epitaxy at temperature of 1050 8C. An additional AlN buffer layer is used between GaN and PS. The crystalline quality and surface morphology of GaN films were studied by X-ray diffraction and scanning electron microscope (SEM), respectively. Preferential growth of hexagonal GaN with h00.1i direction is observed and is ...

متن کامل

Establishing a Two Step FACELO Process in HVPE

In order to reduce the effort needed to create self-separated, freestanding gallium nitride (GaN) layers by thick growth in hydride vapor phase epitaxy (HVPE), we established a two-step facet-controlled lateral overgrowth (FACELO) process in HVPE. Just as for the metalorganic vapor phase epitaxy (MOVPE) FACELO process, the template is produced by MOVPE growth directly on sapphire. This initial ...

متن کامل

Abbreviated MOVPE nucleation of III-nitride light-emitting diodes on nano-patterned sapphire

Metalorganic vapor phase epitaxy (MOVPE) nucleation studies of GaN on planar sapphire and nanopatterned AGOG (Deposition of Aluminum, Growth of Oxide, and Grain growth) sapphire substrates were conducted. The use of abbreviated GaN growth mode, which utilizes a process of using 15 nm low-temperature GaN buffer and bypassing etch-back and recovery processes during epitaxy, enables the growth of ...

متن کامل

Mg-enhanced lateral overgrowth of GaN on patterned GaN/sapphire substrate by selective Metal Organic Vapor Phase Epitaxy

Selective and lateral overgrowth by Metal Organics Vapour Phase Epitaxy (MOVPE) was carried out until coalescence to produce smooth and optically flat thick GaN layers. A GaN epitaxial layer is first grown using atmospheric pressure Metalorganic Vapour Phase Epitaxy on a {0001} Al2O3. substrate. Then a 30Å silicon nitride dielectric film is deposited in-situ by reaction of silane and ammonia to...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Microelectronics Journal

دوره 34  شماره 

صفحات  -

تاریخ انتشار 2003